New Perspectives in Science Education
Dominik Giel
Institution: Offenburg University of Applied Sciences
Address: Badstr. 24
Postal Code: 77652
Country: Germany
Prof. Dominik Giel is a Professor at Hochschule Offenburg, specializing in physics, mathematics, control engineering, data acquisition, process measurement technology, and computer science. He currently serves as the head of the Center for Learning and Teaching (CeLT) at Offenburg University, where he focuses on enhancing educational methodologies and supporting both students and faculty in their teaching and learning endeavors.
Prof. Giel's academic journey includes a Diploma in Physics from the Rheinische Friedrich-Wilhelms-Universität Bonn, where he conducted research on the diffusion of atomic spin polarization in the gas phase using optical magnetic resonance tomography. He earned his doctorate from Heinrich-Heine Universität Düsseldorf, focusing on hologram tomography for surface topometry.
His teaching portfolio encompasses Mathematics, Physics, Control Engineering and Process Measurement Technology and Computer Science.
Prof. Giel's academic journey includes a Diploma in Physics from the Rheinische Friedrich-Wilhelms-Universität Bonn, where he conducted research on the diffusion of atomic spin polarization in the gas phase using optical magnetic resonance tomography. He earned his doctorate from Heinrich-Heine Universität Düsseldorf, focusing on hologram tomography for surface topometry.
His teaching portfolio encompasses Mathematics, Physics, Control Engineering and Process Measurement Technology and Computer Science.
